EM system features

You can upgrade the EM 2040 series to 600 - 700 kHz mode. This feature offers a larger operational depth range and better resolution in shallow waler. This feature is only available for EM 2040 Single RX and EM 2040P. 

This feature allows detections in the water column to be captured in the KMAll format. They can then be used in post-processing. Enable Extra Detection to ensure that echoes from any depth points that deviate noticeably from their adjacent depth points are displayed on the screen and logged correctly. This is useful when you survey wrecks. This ensures that, for instance, echoes from a mast are displayed and recorded.  

Available for all EM systems.

This function enables the multibeam system to change the swath configuration between multibeam pings. This lets you dynamically define the frequency, swath width (coverage) and pulse mode for up to five consecutive pings. By doing this, you generate a true multi-layered dataset. The multi-frequency backscatter feature improves high-resolution inspection surveys using different frequencies simultaneously with the backscatter mosaics for seafloor surface characterization. With MultiFrequency Inspection, the user sets the EM to alternate between a wide swath frequency and a narrow swath high resolution frequency, thus maintaining the coverage requirement and the resolution requirement of the inspection.

This feature is only available for EM 204X Single RX, Dual RX and EM 2040P.

Water column phase logging allows you to do your own bottom or target detections more precisely. This feature is also beneficial for the accurate localization of smaller targets in the water column, such as bubbles.